Study on IMC Analysis and Bondability in Assembly Process

碩士 === 國立中山大學 === 電機工程學系研究所 === 95 === Recently, wirebonding process play an important role in IC assembly packaging manufacture. No degradation of bonding wire interconnection and defect free eutectic alloy bonding offer the high yield and reliability of products. The degradation of Au wire/Al bond...

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Bibliographic Details
Main Authors: Jer-Haur Hsu, 許哲豪
Other Authors: Herng-Yih Ueng
Format: Others
Language:zh-TW
Published: 2007
Online Access:http://ndltd.ncl.edu.tw/handle/d93rzv