Wireless Built-in Self-Repair Architectures for Embedded RAMs
碩士 === 輔仁大學 === 電子工程學系 === 96 === In today’s nanometer technology era, the density and capacity of the system-on-a-chip (SOC) is increasing significantly. On the contrary, it is more difficult for SOC testing. Besides, we know that the investment in the ATEs becomes more expensive than before due to...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2008
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| Online Access: | http://ndltd.ncl.edu.tw/handle/76788592169047110796 |