The Stress Analysis of GaN MSM Photodetectors with TiW Electrodes
碩士 === 南台科技大學 === 電子工程系 === 96 === In this thesis, the reliability of GaN MSM photodetectors with TiW electrode was analyzed and characterized under different stressing condition. The result showed that the dark current and responsivity of devices decayed with the aging temperature and aging current...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2008
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| Online Access: | http://ndltd.ncl.edu.tw/handle/14581437519502063016 |