Investigating the interfacial band alignments at Hf-based gate dielectrics
碩士 === 中國文化大學 === 材料科學與奈米科技研究所 === 97 === The trend of shrinking gate dielectric thickness rapidly in device, the tunneling effect generates a great leakage current. According to this reason, the conventional material (SiO2) which used at gate dielectric has to replace. Hafnium is considered as the...
Main Authors: | Ming-Yuan Wu, 吳明遠 |
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Other Authors: | S.Y. Tan |
Format: | Others |
Language: | zh-TW |
Published: |
2009
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Online Access: | http://ndltd.ncl.edu.tw/handle/79182881037102906352 |
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