Microstructures and Electrical Properties of Cr-Si Thin Films

碩士 === 國立臺北科技大學 === 材料科學與工程研究所 === 97 === Current study investigates microstructures of hot pressed Cr-Si alloys and their sputtered thin film properties. The apparent densities of Cr-Si alloys are related to Cr/Si interdiffusion. The porosity increases with Si concentration. It has to do with the d...

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Bibliographic Details
Main Authors: Hung-Xsien Huang, 黃泓憲
Other Authors: 陳貞光
Format: Others
Language:zh-TW
Published: 2009
Online Access:http://ndltd.ncl.edu.tw/handle/x2vc28