Study of Wurtzite InN epilayer and related defect analysis

博士 === 國立彰化師範大學 === 機電工程學系 === 98 === The growth of InN thin films using plasma-assisted molecular beam epitaxy has been explored and the material properties of InN have been characterized by various technologies. Patterned substrates were designed to facilitate dislocation slipping and hence to re...

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Bibliographic Details
Main Authors: Wang, Yan-Hsin, 王彥欣
Other Authors: Chen, Ming-Fei
Format: Others
Language:en_US
Published: 2010
Online Access:http://ndltd.ncl.edu.tw/handle/99556000517431157241

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