RHEED Chevron image analysis for the real time evolution of nanostructure shape
碩士 === 國立東華大學 === 電子工程研究所 === 98 === An analytical method is proposed to determine the part of profiles that is observable as the chevron patterns with RHEED (Reflection High Energy Electron Diffraction) during MBE growth. It is based on the analysis of the diffraction and refraction effects of the...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2010
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| Online Access: | http://ndltd.ncl.edu.tw/handle/88511172192330365731 |