The study on applying RFID to the MES for wafer testing industry.
碩士 === 南台科技大學 === 資訊管理系 === 98 === For the semiconductor wafer testing industry, the manufacturing process and category of product are more complex, and the timely and correct information must be provided to the customers, a single management system is already not able to fully control. Therefore, a...
Main Authors: | Yen-Ching Fang, 方燕卿 |
---|---|
Other Authors: | Yi-Hsing Chang |
Format: | Others |
Language: | zh-TW |
Published: |
2010
|
Online Access: | http://ndltd.ncl.edu.tw/handle/68967512503316141650 |
Similar Items
-
The RFID Applications for Wafer Testing Automation Process
by: Li Tai, et al.
Published: (2015) -
Applying RFID to the SECS/GEM automatic wafer coating system.
by: Tzu-Kun Hung, et al.
Published: (2014) -
Modeling and Simulation of the MES-Controlled Wafer Fabrication Process
by: Chi-Hung Liu, et al.
Published: (2006) -
RFID Based Manufacturing Process of Cloud MES
by: Chuang Wang, et al.
Published: (2018-10-01) -
Performance prediction of MES system - case study on DRAM wafer fabrication
by: KungYu Hsiao, et al.
Published: (2009)