Detailed Routing for FIB Probing
碩士 === 國立中央大學 === 電機工程研究所 === 100 === In the process of manufacturing a chip, a circuit layout which is affected by particles or design errors may cause that the chip operation differs with the desired one. As a result, post-silicon debug becomes a critical and necessary step in the current design f...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/78625112058766268971 |