Investigation on Passivation Processes of Heterojunction Silicon Solar Cell
碩士 === 明道大學 === 材料科學與工程學系碩士班 === 101 === In this study, etching process and passivation effect on n-type heterojunction solar cells are investigated. The tecturing time are varied to fabricate different texturing size and shape. After comparing the influence of all the etching parameters on reflecta...
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ndltd-TW-101MDU001590172015-10-13T22:18:22Z http://ndltd.ncl.edu.tw/handle/30531242558470939368 Investigation on Passivation Processes of Heterojunction Silicon Solar Cell 異質接面太陽能電池之鈍化製程研究 Chia-Chi Tsou 鄒嘉琪 碩士 明道大學 材料科學與工程學系碩士班 101 In this study, etching process and passivation effect on n-type heterojunction solar cells are investigated. The tecturing time are varied to fabricate different texturing size and shape. After comparing the influence of all the etching parameters on reflectance and minority carrier lifetime, HF-PECVD system is hired to deposit amorphous silicon doped hydrogen films in different process condition such as process power in the range of 10~25 W, flow of hydrogen in the range of 120~240 sccm, and E/S distance in the range of 10~40 mm. Then we employ QSSPC、FTIR measurement to evaluate lifetime, morphology, and ratio of strong and weak bonds, respectively. Finally, the optimized parameters of substrates and a-Si films are applied to PC1D simulation software to investigate the effect of minority carrier lifetime on efficiency and EQE measurement. Shui-Yang Lien 連水養 2013 學位論文 ; thesis 99 zh-TW |
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碩士 === 明道大學 === 材料科學與工程學系碩士班 === 101 === In this study, etching process and passivation effect on n-type heterojunction solar cells are investigated. The tecturing time are varied to fabricate different texturing size and shape. After comparing the influence of all the etching parameters on reflectance and minority carrier lifetime, HF-PECVD system is hired to deposit amorphous silicon doped hydrogen films in different process condition such as process power in the range of 10~25 W, flow of hydrogen in the range of 120~240 sccm, and E/S distance in the range of 10~40 mm. Then we employ QSSPC、FTIR measurement to evaluate lifetime, morphology, and ratio of strong and weak bonds, respectively. Finally, the optimized parameters of substrates and a-Si films are applied to PC1D simulation software to investigate the effect of minority carrier lifetime on efficiency and EQE measurement.
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author2 |
Shui-Yang Lien |
author_facet |
Shui-Yang Lien Chia-Chi Tsou 鄒嘉琪 |
author |
Chia-Chi Tsou 鄒嘉琪 |
spellingShingle |
Chia-Chi Tsou 鄒嘉琪 Investigation on Passivation Processes of Heterojunction Silicon Solar Cell |
author_sort |
Chia-Chi Tsou |
title |
Investigation on Passivation Processes of Heterojunction Silicon Solar Cell |
title_short |
Investigation on Passivation Processes of Heterojunction Silicon Solar Cell |
title_full |
Investigation on Passivation Processes of Heterojunction Silicon Solar Cell |
title_fullStr |
Investigation on Passivation Processes of Heterojunction Silicon Solar Cell |
title_full_unstemmed |
Investigation on Passivation Processes of Heterojunction Silicon Solar Cell |
title_sort |
investigation on passivation processes of heterojunction silicon solar cell |
publishDate |
2013 |
url |
http://ndltd.ncl.edu.tw/handle/30531242558470939368 |
work_keys_str_mv |
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