Measurement of reflectance anisotropy spectroscopy of m-plane and c-plane zinc oxide semiconductor by using twisted nematic liquid crystals
碩士 === 國立中山大學 === 物理學系研究所 === 101 === Twisted nematic liquid crystals were used to measure reflectance anisotropy spectroscopy of m-plane and c-plane ZnO bulks. This experimental setup was based on Aspnes’s experimental setup in 1988 (D. E. Aspnes, J. P. Harbison, A. A. Studna and L. T. Florez, Appl...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2013
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| Online Access: | http://ndltd.ncl.edu.tw/handle/g4p8xy |