Use accelerated life test to estimate product life and reliability

• Main Authors: Shih-Chieh Hung, 洪師傑
• Other Authors: none
• Format: Others
• Language: zh-TW
• Published: 2013
• Online Access: http://ndltd.ncl.edu.tw/handle/56136110359051886267

碩士 === 國立臺灣科技大學 === 機械工程系 === 101 === Time for many people is a simple unit, but from a company development new product point of view, decrease developing time can get most profit. How to keep the excellent product reliability is an important task. The engineer can use ALT (accelerated life test) estimate the product lifetime in the developing stage and provide reliability parameters as a reference for managers. This study will use the motherboards as a test sample, to research the motherboards life under the temperature cycling. The product was put to the test, setting a series of accelerated stress (-30℃~70℃ and -40℃~80℃) to get product failure numbers in a short period of time. In the data analysis, use the Coffin-Manson formula and life expectancy estimate with Weibull distribution. Expectations through the environment stress to get lifetime reliability under normal operating.