Application of Lean Six Sigma to improve the yield of TAB process in TFT-LCD JI process
碩士 === 亞洲大學 === 光電與通訊學系碩士在職專班 === 102 === This study applies This study applies the method of LSS (Lean Six Sigma) to improve the yield of TAB (Tape Automated Bonding) in TFT-LCD industry. This research uses a LSS (Lean Six Sigma) basis to Define, Measure, Analyze, Improve and Control (DMAIC) to red...
Main Authors: | HUANG, YEN-CHI, 黃彥綺 |
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Other Authors: | CHANG, CHING-HAUR |
Format: | Others |
Language: | zh-TW |
Published: |
2014
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Online Access: | http://ndltd.ncl.edu.tw/handle/74021753138701422131 |
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