Positioning and manipulation of gold nanoparticles with atomic force microscope
碩士 === 國立交通大學 === 材料科學與工程學系奈米科技碩博士班 === 103 === Atomic force microscope (AFM) have been applied to scan surface topography, tip-substrate force measurements and nanoscale manipulation for years. It is now technically possible to move nanoparticles on a plane, but still very hard to manipulate na...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/8veed4 |