The Order Effect of Wafer Defect Detection in the Clustering of Wafer Bin Maps

The Order Effect of Wafer Defect Detection in the Clustering of Wafer Bin Maps

碩士 === 國立成功大學 === 統計學系 === 104

Bibliographic Details
Main Authors: Ming-JieHsu, 許明傑
Other Authors: Shuen-Lin Jeng
Format: Others
Language:en_US
Published: 2017
Online Access:http://ndltd.ncl.edu.tw/handle/bfw23e
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spelling ndltd-TW-104NCKU53370212019-05-15T23:47:00Z http://ndltd.ncl.edu.tw/handle/bfw23e The Order Effect of Wafer Defect Detection in the Clustering of Wafer Bin Maps 晶圓片缺陷量測次序效應對晶圓圖分群影響之探討 Ming-JieHsu 許明傑 碩士 國立成功大學 統計學系 104 Shuen-Lin Jeng 鄭順林 2017 學位論文 ; thesis 283 en_US
collection NDLTD
language en_US
format Others
sources NDLTD
description 碩士 === 國立成功大學 === 統計學系 === 104
author2 Shuen-Lin Jeng
author_facet Shuen-Lin Jeng
Ming-JieHsu
許明傑
author Ming-JieHsu
許明傑
spellingShingle Ming-JieHsu
許明傑
The Order Effect of Wafer Defect Detection in the Clustering of Wafer Bin Maps
author_sort Ming-JieHsu
title The Order Effect of Wafer Defect Detection in the Clustering of Wafer Bin Maps
title_short The Order Effect of Wafer Defect Detection in the Clustering of Wafer Bin Maps
title_full The Order Effect of Wafer Defect Detection in the Clustering of Wafer Bin Maps
title_fullStr The Order Effect of Wafer Defect Detection in the Clustering of Wafer Bin Maps
title_full_unstemmed The Order Effect of Wafer Defect Detection in the Clustering of Wafer Bin Maps
title_sort order effect of wafer defect detection in the clustering of wafer bin maps
publishDate 2017
url http://ndltd.ncl.edu.tw/handle/bfw23e
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AT xǔmíngjié theordereffectofwaferdefectdetectionintheclusteringofwaferbinmaps
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AT xǔmíngjié ordereffectofwaferdefectdetectionintheclusteringofwaferbinmaps
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