Characterizations and analyses of the ZnO and ZnO : B grown on the (100), (111), textured silicon, and ITO glass substrates
碩士 === 國立高雄大學 === 應用物理學系碩士班 === 105 === First, zinc oxides (ZnO) thin films are grown on the planar (100), planar (111), and textured (100) three different silicon substrates. They are characterized and analyzed by various methods, such as cathode luminescence (CL), Raman spectroscopy, scanning elec...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2016
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| Online Access: | http://ndltd.ncl.edu.tw/handle/92287609090414765193 |