Two-Product Mixed-Run Run-to-Run Control for Drifted Process

碩士 === 國立清華大學 === 統計學研究所 === 105 === Exponentially weighted moving average (EWMA) feedback controller has been widely used in semiconductor manufacturing processes. The long-term stability and short-term performance of EWMA control scheme have been addressed by several studies in the literatures. Mo...

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Bibliographic Details
Main Authors: Chiang, Chung-Li, 蔣崇立
Other Authors: Hsu, Nan-Jung
Format: Others
Language:zh-TW
Published: 2017
Online Access:http://ndltd.ncl.edu.tw/handle/9zev4m