Test and Diagnosis Methodology for Various Fault Models in Logic Circuits
博士 === 國立成功大學 === 電機工程學系 === 106 === With the shrinking manufacturing process and increasing design complexity, the defect behaviors in contemporary integrated circuits have become much more complex than ever. It is generally realized that the test set for a simple, single fault model such as the st...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2018
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| Online Access: | http://ndltd.ncl.edu.tw/handle/se3vxu |