The Influence of the Cleaning Methods on the Yield of IC Test Process

碩士 === 高苑科技大學 === 電子工程研究所 === 107 === Time is money, but time is not able to be bought by money. It shows that, how expensive the time to us! How to improve yield in the production line is a race against time, and the test environment will be great and correct. Those time cost should be saved, which...

Full description

Bibliographic Details
Main Authors: LIU,KENG-FU, 劉耕甫
Other Authors: WEI,YIN-FANG
Format: Others
Language:zh-TW
Published: 2019
Online Access:http://ndltd.ncl.edu.tw/handle/mq59xf