A Convolutional Neural Network for AOI Defect Classification
碩士 === 國立臺灣科技大學 === 工業管理系 === 107 === In generally, the miniaturization of electronic products and the requirement on yield rate are extremely demanding, causing Automated Optical Inspection (AOI) to have over sifting problem due to the increased sensitivity, which often leads to a rising in the cos...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2019
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| Online Access: | http://ndltd.ncl.edu.tw/handle/xzksas |