The Statistics of the Transmission-Secondary-Electron-Emission (TSEM) from Negative-Electron-Affinity (NEA) Silicon

The Statistics of the Transmission-Secondary-Electron-Emission (TSEM) from Negative-Electron-Affinity (NEA) Silicon

Bibliographic Details
Main Author:	Ling, Y. S.
Published:	Queen Mary, University of London 1976
Subjects:	530.412
Online Access:	http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.463331

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