Simultaneous switching noise: the relation between bus layout and coding
As device geometries shrink and power supply voltages decrease, simultaneous switching noise (SSN) is having a detrimental effect on IC reliability. This article analyzes the impact of different bus transitions on SSN. Transitions involving the same number of switching signals, but with different pl...
Main Authors: | Rossi, Daniele (Author), Niewland, Andre' (Author), Metra, Cecilia (Author) |
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Format: | Article |
Language: | English |
Published: |
2008-01.
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Subjects: | |
Online Access: | Get fulltext |
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