Fault-Tolerant Architecture for Reliable Integrated Gate Drivers

by Jongbin Kim, Hoon-Ju Chung, Seung-Woo Lee
Published 2019-01-01

A Novel Shielded IGBT (SIGBT) With Integrated Diodes

by Rongxin Chen, Hao Hu, Yuan Lin, Xing Bi Chen
Published 2020-01-01

A Temperature Compensation Method by Adjusting Gamma Voltages for High Luminance Uniformity of Active Matrix Organic Light-Emitting Diode Displays

by Jun-Seok Na, Seong-Kwan Hong, Oh-Kyong Kwon
Published 2020-01-01

SiC Planar MOSFETs With Built-In Reverse MOS-Channel Diode for Enhanced Performance

by Xintian Zhou, Hao Gong, Yunpeng Jia, Dongqing Hu, Yu Wu, Tian Xia, Haoyang Pang, Yuanfu Zhao
Published 2020-01-01

Effects of Forming Gas Annealing and Channel Dimensions on the Electrical Characteristics of FeFETs and CMOS Inverter

by Po-Jung Sung, Chun-Jung Su, Shih-Hsuan Lo, Fu-Kuo Hsueh, Darsen D. Lu, Yao-Jen Lee, Tien-Sheng Chao
Published 2020-01-01

Materials Requirements of High-Speed and Low-Power Spin-Orbit-Torque Magnetic Random-Access Memory

by Xiang Li, Shy-Jay Lin, Mahendra Dc, Yu-Ching Liao, Chengyang Yao, Azad Naeemi, Wilman Tsai, Shan X. Wang
Published 2020-01-01

2.3 kV 4H-SiC Accumulation-Channel Split-Gate Planar Power MOSFETs With Reduced Gate Charge

by Aditi Agarwal, Kijeong Han, B. Jayant Baliga
Published 2020-01-01

1/<inline-formula> <tex-math notation="LaTeX">${f}^{\gamma}$ </tex-math></inline-formula> Low Frequency Noise Model for Buried Channel MOSFET

by Shi Shen, Jie Yuan
Published 2020-01-01

High Performance and Highly Robust AlN/GaN HEMTs for Millimeter-Wave Operation

by Kathia Harrouche, Riad Kabouche, Etienne Okada, Farid Medjdoub
Published 2019-01-01

Impact of the Crystal Phase of ZrO&#x2082; on Charge Trapping Memtransistor as Synaptic Device for Neural Network Application

by Yu-Che Chou, Chien-Wei Tsai, Chin-Ya Yi, Wan-Hsuan Chung, Chao-Hsin Chien
Published 2020-01-01

An Analytical Breakdown Model for the SOI LDMOS With Arbitrary Drift Doping Profile by Using Effective Substrate Voltage Method

by Kemeng Yang, Yufeng Guo, Jun Zhang, Jiafei Yao, Man Li, Ling Du, Xiaoming Huang
Published 2020-01-01

Performance Investigation of an n-Type Tin-Oxide Thin Film Transistor by Channel Plasma Processing

by Z. W. Shang, J. Ma, W. D. Liu, Y. C. Fan, H. H. Hsu, Z. W. Zheng, C. H. Cheng
Published 2020-01-01

High Hall-Effect Mobility of Large-Area Atomic-Layered Polycrystalline ZrS₂ Film Using UHV RF Magnetron Sputtering and Sulfurization

by Masaya Hamada, Kentaro Matsuura, Takuro Sakamoto, Iriya Muneta, Takuya Hoshii, Kuniyuki Kakushima, Kazuo Tsutsui, Hitoshi Wakabayashi
Published 2019-01-01

Parameter Extraction and Compact Modeling of 1/f Noise for Amorphous ESL IGZO TFTs

by Wondwosen E. Muhea, Gerard U. Castillo, Harold C. Ordonez, Thomas Gneiting, Gerard Ghibaudo, Benjamin Iniguez
Published 2020-01-01

Leading-Edge Thin-Layer MOSFET Potential Modeling Toward Short-Channel Effect Suppression and Device Optimization

by Fernando Avila Herrera, Yoko Hirano, Takahiro Iizuka, Mitiko Miura-Mattausch, Hideyuki Kikuchihara, Dondee Navarro, Hans Jurgen Mattausch, Akira Ito
Published 2019-01-01

Substrate Engineering of Inductors on SOI for Improvement of Q-Factor and Application in LNA

by Arun Bhaskar, Justine Philippe, Vanessa Avramovic, Flavie Braud, Jean-Francois Robillard, Cedric Durand, Daniel Gloria, Christophe Gaquiere, Emmanuel Dubois
Published 2020-01-01

Reverse Leakage Analysis for As-Grown and Regrown Vertical GaN-on-GaN Schottky Barrier Diodes

by Kai Fu, Houqiang Fu, Xuanqi Huang, Tsung-Han Yang, Chi-Yin Cheng, Prudhvi Ram Peri, Hong Chen, Jossue Montes, Chen Yang, Jingan Zhou, Xuguang Deng, Xin Qi, David J. Smith, Stephen M. Goodnick, Yuji Zhao
Published 2020-01-01

A T-Shaped SOI Tunneling Field-Effect Transistor With Novel Operation Modes

by Chenhe Liu, Qinghua Ren, Zhixi Chen, Lantian Zhao, Chang Liu, Qiang Liu, Wenjie Yu, Xinke Liu, Qing-Tai Zhao
Published 2019-01-01

Test System for Thin Film Transistor Parameter Extraction in Active Matrix Backplanes

by Sanil Daniel, Aswathi Nair, Sanjiv Sambandan
Published 2019-01-01

Dimension Scaling Effects on Conduction and Low Frequency Noise Characteristics of ITO-Stabilized ZnO Thin Film Transistors

by Yuan Liu, Yu-Xuan Huang, Sunbin Deng, Man Wong, Hoi-Sing Kwok, Rongsheng Chen
Published 2020-01-01