Investigation of Re-Program Scheme in Charge Trap-Based 3D NAND Flash Memory

by Ting Cheng, Jianquan Jia, Lei Jin, Xinlei Jia, Shiyu Xia, Jianwei Lu, Kaiwei Li, Zhe Luo, Da Li, Hongtao Liu, Qiguang Wang, An Zhang, Daohong Yang, Zongliang Huo
Published 2021-01-01

Time-Dependent Dielectric Breakdown of Commercial 1.2 kV 4H-SiC Power MOSFETs

by Tianshi Liu, Shengnan Zhu, Marvin H. White, Arash Salemi, David Sheridan, Anant K. Agarwal
Published 2021-01-01

Capacitor Reused Gate Driver for Compact In-Cell Touch Displays

by Shuai Shen, Congwei Liao, Jiwen Yang, Hailong Jiao, Shengdong Zhang
Published 2021-01-01

Design and Simulation of Near-Terahertz GaN Photoconductive Switches–Operation in the Negative Differential Mobility Regime and Pulse Compression

by Shaloo Rakheja, Kexin Li, Karen M. Dowling, Adam M. Conway, Lars F. Voss
Published 2021-01-01

Improved Low-Frequency Noise in Recessed-Gate E-Mode AlGaN/GaN MOS-HEMTs Under Electrical and Thermal Stress

by Qianlan Hu, Chengru Gu, Dan Zhan, Xuefei Li, Yanqing Wu
Published 2021-01-01

Light-Controlled Gap-Type TFT Used for Large-Area Under-Screen Fingerprint Sensor

by Ya-Hsiang Tai, Cheng-Che Tu, Yi-Cheng Yuan, Yu-Jia Chang, Mao-Hsiu Hsu, Che-Yu Chuang
Published 2021-01-01

Under-FET Thermal Sensor Enabling Smart Full-Chip Run-Time Thermal Management

by Cheng Li, Qi Chen, Feilong Zhang, Mengfu Di, Zijin Pan, Fei Lu, Albert Wang
Published 2020-01-01

Improved Performance of InGaZnO Thin-Film Transistor With Ti Incorporation Into La₂O₃ Gate Dielectric

by J. Q. Song, Y. Q. Yu, K. L. Zheng, Y. T. Su
Published 2021-01-01

Sensitivity Improvement of a Fully Symmetric Vertical Hall Device Fabricated in 0.18 μm Low-Voltage CMOS Technology

by Haiyun Huang, Yue Xu
Published 2021-01-01

An Inclusive Structural Analysis on the Design of 1.2kV 4H-SiC Planar MOSFETs

by Dongyoung Kim, Nick yun, Seung Yup Jang, Adam J. Morgan, Woongje Sung
Published 2021-01-01

Erratum to “Effect of the Blocking Oxide Layer With Asymmetric Taper Angles in 3-D NAND Flash Memories”

by Jun Gyu Lee, Woo Je Jung, Jae Hyeon Park, Keon-Ho Yoo, Tae Whan Kim
Published 2021-01-01

Study on CDM ESD Robustness Among On-Chip Decoupling Capacitors in CMOS Integrated Circuits

by Yi-Chun Huang, Ming-Dou Ker
Published 2021-01-01

Stress Engineering for Drive Current Enhancement in Silicon Carbide (SiC) Power MOSFETs

by Suvendu Nayak, Saurabh Lodha, Swaroop Ganguly
Published 2021-01-01

Demonstration of Low-Temperature Fine-Pitch Cu/SiO₂ Hybrid Bonding by Au Passivation

by Demin Liu, Po-Chih Chen, Tzu-Chieh Chou, Han-Wen Hu, Kuan-Neng Chen
Published 2021-01-01

Impact of Die Carrier on Reliability of Power LEDs

by Shusmitha Kyatam, Luis N. Alves, Stanislav Maslovski, Joana C. Mendes
Published 2021-01-01

Improved Turn-Off Speed and Uniformity of Atomic Threshold Switch Device by AgSe Electrode and Bipolar Pulse Forming

by Seungyeol Oh, Seungwoo Lee, Hyunsang Hwang
Published 2021-01-01

Design and Numerical Verification of a Gate-Controlled Lateral Thyristor for Low-Light Level Detection

by Keyang Sun, Liyang Pan, Dong Wu, Jun Xu, Zheyao Wang
Published 2021-01-01

On the Challenges of Reliable Threshold Voltage Measurement in Ohmic and Schottky Gate p-GaN HEMTs

by Karthick Murukesan, Loizos Efthymiou, Florin Udrea
Published 2021-01-01

Effect of the Blocking Oxide Layer With Asymmetric Taper Angles in 3-D NAND Flash Memories

by Jun Gyu Lee, Woo Je Jung, Jae Hyeon Park, Keon-Ho Yoo, Tae Whan Kim
Published 2021-01-01

MgZnO-Based Negative Capacitance Transparent Thin-Film Transistor Built on Glass

by Fangzhou Yu, Wen-Chiang Hong, Guangyuan Li, Yuxuan Li, Ming Lu, Yicheng Lu
Published 2021-01-01