Modeling and Analysis of Double Channel GaN HEMTs Using a Physics-Based Analytical Model

by Rasik Rashid Malik, Mehak Ashraf Mir, Zarak Bhat, Ahtisham Pampori, Yogesh Singh Chauhan, Sheikh Aamir Ahsan
Published 2021-01-01

A Novel Split-Gate-Trench MOSFET Integrated With Normal Gate and Built-In Channel Diode

by Xinyu Li, Yunpeng Jia, Xintian Zhou, Yuanfu Zhao, Yu Wu, Dongqing Hu, Xingyu Fang, Zhonghan Deng
Published 2021-01-01

Determining Two-Dimensional Phosphor Surface Temperature Distribution of Phosphor-Coated LEDs Based on Hyper-Spectral Imaging

by Chen Yang, Zhi-Hui Li, Zhen Li, Fang-Yuan Zhu, Hui-Min Chen, Yu-Jia Gong, Xiao-Ya Dong, Zi-Quan Guo, Guo-Long Chen, Li-Hong Zhu, Huan-Ting Chen, Jian Xu, Yuan Shi, Jie Chen, Mei-Bin Yao, Yi-Jun Lu, Zhong Chen
Published 2021-01-01

Quality in Simulation-Only Manuscripts Submitted to J-EDS

by Enrico Sangiorgi
Published 2021-01-01

Influence of the DLC Passivation Conductivity on the Performance of Silicon High-Power Diodes Over an Extended Temperature Range

by L. Balestra, S. Reggiani, A. Gnudi, E. Gnani, J. Dobrzynska, J. Vobecky
Published 2021-01-01

Phenomenological Model of Gate-Dependent Kink in I-V Characteristics of MoS₂ Double-Gate FETs

by Michael A. Rodder, Ananth Dodabalapur
Published 2021-01-01

Direct Defect-Level Analysis of Metal–Insulator–Metal Capacitor Using Internal Photoemission Spectroscopy

by Tae Jin Yoo, Hyeon Jun Hwang, Soo Cheol Kang, Sunwoo Heo, Ho-In Lee, Young Gon Lee, Hokyung Park, Byoung Hun Lee
Published 2021-01-01

Photostability Study of Inverted Polymer Solar Cells Under AM 1.5G and LED Illumination via Impedance Spectroscopy

by Alfonsina Abat Amelenan Torimtubun, Jose G. Sanchez, Josep Pallares, Lluis F. Marsal
Published 2021-01-01

Microstructure and Granularity Effects in Electromigration

by Lado Filipovic, Siegfried Selberherr
Published 2021-01-01

Extensive Electrical Characterization Methodology of Advanced MOSFETs Towards Analog and RF Applications

by Valeriya Kilchytska, Sergej Makovejev, Babak Kazemi Esfeh, Lucas Nyssens, Arka Halder, Jean-Pierre Raskin, Denis Flandre
Published 2021-01-01

Dynamic Simulation of a-IGZO TFT Circuits Using the Analytical Full Capacitance Model (AFCM)

by Y. Hernandez-Barrios, J. N. Gaspar-Angeles, M. Estrada, B. Iniguez, A. Cerdeira
Published 2021-01-01

Does the Threshold Voltage Extraction Method Affect Device Variability?

by Gabriel Espineira, Antonio J. Garcia-Loureiro, Natalia Seoane
Published 2021-01-01

Noise-Based Simulation Technique for Circuit-Variability Analysis

by Aristeidis Nikolaou, Jakob Leise, Jakob Pruefer, Ute Zschieschang, Hagen Klauk, Ghader Darbandy, Benjamin Iniguez, Alexander Kloes
Published 2021-01-01

Inkjet Printed Electrodes in Thin Film Transistors

by Ruiqiang Tao, Honglong Ning, Jianqiu Chen, Jianhua Zou, Zhiqiang Fang, Caigui Yang, Yicong Zhou, Jianhua Zhang, Rihui Yao, Junbiao Peng
Published 2018-01-01

Novel Low Loss LIGBT With Assisted Depletion N-Region and P-Buried Layer

by Licheng Sun, Baoxing Duan, Yintang Yang
Published 2021-01-01

Fabrication and Characterization of GaN-Based Fin-Channel Array Metal-Oxide-Semiconductor High-Electron Mobility Transistors With Recessed-Gate and Ga₂O₃ Gate Insulat...

by Hsin-Ying Lee, Ting-Wei Chang, Edward Yi Chang, Niklas Rorsman, Ching-Ting Lee
Published 2021-01-01

Parasitic Capacitance Analysis of Three-Independent-Gate Field-Effect Transistors

by Patsy Cadareanu, Jorge Romero-Gonzalez, Pierre-Emmanuel Gaillardon
Published 2021-01-01

The Impact of LCE and PAMDLE Regarding Different CMOS ICs Nodes and High Temperatures

by Egon Henrique Salerno Galembeck, Christian Renaux, Jacobus Willibrordus Swart, Denis Flandre, Salvador Pinillos Gimenez
Published 2021-01-01

Physical Modeling of <italic>p</italic>-Type Fluorinated Al-Doped Tin-Oxide Thin Film Transistors

by Kadiyam Rajshekar, Hsiao-Hsuan Hsu, Koppolu Uma Mahendra Kumar, P. Sathyanarayanan, V. Velmurugan, Chun-Hu Cheng, D. Kannadassan
Published 2020-01-01

A Snapback-Free and Low Turn-Off Loss Reverse-Conducting SOI-LIGBT With Embedded Diode and MOSFET

by Jiayu Wu, Haimeng Huang, Bo Yi, Hao Hu, Huan Hu, Xing Bi Chen
Published 2019-01-01