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1by Guntzel, Jose Luis AlmadaSubjects: “...Automatic test pattern generation (ATPG)...”
Published 2007
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2by Guntzel, Jose Luis AlmadaSubjects: “...Automatic test pattern generation (ATPG)...”
Published 2007
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3by Guntzel, Jose Luis AlmadaSubjects: “...Automatic test pattern generation (ATPG)...”
Published 2007
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4by Meinhardt, Cristina“... basic types of cell design with FinFET technology. Main objectives are to characterize timing and power...”
Published 2015
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5by Meinhardt, Cristina“... basic types of cell design with FinFET technology. Main objectives are to characterize timing and power...”
Published 2015
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6by Meinhardt, Cristina“... basic types of cell design with FinFET technology. Main objectives are to characterize timing and power...”
Published 2015
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7by Meinhardt, Cristina“... is achieved using basic patterns repeated along one matrix structure. Regularity is pointed like one...”
Published 2007
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8by Meinhardt, Cristina“... is achieved using basic patterns repeated along one matrix structure. Regularity is pointed like one...”
Published 2007
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9by Meinhardt, Cristina“... is achieved using basic patterns repeated along one matrix structure. Regularity is pointed like one...”
Published 2007
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