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1by Verruno, Marina“...Résumé : Les instruments de spectrométrie de masse à ionisation secondaire (SIMS) doivent être...”
Published 2017
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3by Bardin, NoémieSubjects: “...Fractionnement en masse instrumental...”
Published 2015
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4by Fu, Tingting“... d’agrégats lourds sont encore mal compris. D'un autre côté, techniquement, les instruments TOF-SIMS...”
Published 2017
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5by Verzeroli, Elodie“... for the chemical analysis of the elements emitted from the sample surface.The NAPIS source delivers a primary beam...”
Published 2017
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6by Riu, Lucie“... with MicrOmega revealing the ability of this instrument to characterize samples at a microscopic scale (10s μm/px)....”
Published 2017
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