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Showing 1 - 10 results of 10 for search 'ELECTRONIC AND SEMICONDUCTOR MATERIALS', query time: 0.70s Refine Results
  1. 1
    Boron-doped amorphous carbon film grown by bias assisted pyrolysis chemical vapor deposition
    by Annuar, I., Rouhi, J., Rusop, M.
    Published 2015
    Subjects: “...Electronic materials...”
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    Article
  2. 2
    Al doped LiNi0.6Co0.3-xTi0.1AlxO2 cathode material via combustion method
    Subjects: “...Semiconductor materials...”
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    Article
  3. 3
    Multi-ion scattering of charged carriers by ionized impurities in heavily doped semiconductors: From bulk to nanowires
    Subjects: “...Doped semiconductors...”
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    Article
  4. 4
    First-principles studies for electronic structure and optical properties of p-type calcium doped α-ga2o3
    Subjects: “...Electronic structure...”
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    Article
  5. 5
    Role of intrinsic defects in cubic NaNbO3: A computational study based on hybrid density-functional theory
    by Albe, K., Ghorbani, E., Villa, L.
    Published 2022
    Subjects: “...Candidate materials...”
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    Article
  6. 6
    Rare-earth defects in GaN: A systematic investigation of the lanthanide series
    by Hoang, K.
    Published 2022
    Subjects: “...Electronic structure...”
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    Article
  7. 7
    An efficient and stable lead-free organic–inorganic tin iodide perovskite for photovoltaic device: Progress and challenges
    Subjects: “...Electron transport properties...”
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    Article
  8. 8
    Thermal stability of electrical parameters of silicon crystal doped with nickel during growth
    Subjects: “...Semiconductor devices...”
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    Article
  9. 9
    Alloyed β-(Al xGa1- x)2O3bulk Czochralski single β-(Al0.1Ga0.9)2O3and polycrystals β-(Al0.33Ga0.66)2O3, β-(Al0.5Ga0.5)2O3), and property trends
    Subjects: “...High resolution transmission electron microscopy...”
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    Article
  10. 10
    Room temperature magnetic field modulation of diode-like behavior in Ca-doped BiFeO3thin films
    by Dong, C., Li, J., Li, J., Li, M., Wang, X., Wu, L.
    Published 2022
    Subjects: “...High resolution transmission electron microscopy...”
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    Article
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