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Scanning electron microscopy
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Field emission microscopes
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Field emission scanning electron microscopy
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Oxide films
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Silicon substrates
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Thin films
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Surface morphology
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Zinc oxide
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Ammonium hydroxide
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Amorphous carbon
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Annealing
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Applied bias voltage
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Applied potentials
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Atomic force microscopy
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Band gap energy
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4Subjects: “...Field emission scanning electron microscopy...”
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7by Busse, C., Fischer, J., Jolie, W., Komsa, H.-P, Michely, T., Murray, C., Van Efferen, C.Subjects: “...Layered semiconductors...”
Published 2022
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8by Benetti, M., Buzzin, A., Caliendo, C., Cannatà, D., de Cesare, G., Grossi, F., Verona, E.Subjects: “...II-VI semiconductors...”
Published 2023
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9Subjects: “...Field emission scanning electron microscopy...”
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