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1“... and improve products yield rate are the main issues for packaging. This research uses a semi-automatic EMC...”
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2“... to the failure of IC packaging, low productivity, poor reliability, etc. Therefore, the current issues which...”
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3“...碩士 === 國立成功大學 === 工程科學系碩博士班 === 100 === During the process of electronic IC packaging, epoxy...”
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4“... products, including defective edge and uneven surface, which might result in the failure of packaging, low...”
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5“..., high speed, low power production on the advantages of the device will be used to wafer bonding...”
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6“... and specimen coating and improve products yield rate are the main issues for packaging. This research...”
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7“...碩士 === 國立成功大學 === 工程科學系碩博士班 === 91 === In IC packaging, when epoxy molding compound(EMC)is filling...”
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8“...碩士 === 國立成功大學 === 工程科學系碩博士班 === 97 === In IC packaging, when epoxy molding compound (EMC) is filled...”
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9“...碩士 === 國立成功大學 === 工程科學系碩博士班 === 98 === In IC packaging, when epoxy molding compound (EMC) is filled...”
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10“... rapidly, from integrated circuits to the electronic packaging and other industries. The thin film...”
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11“..., package designer can do a better design for process impact problem improvement before production. ...”
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12“... product during ejection and cause the package to fail and decrease the product quality and reliability...”
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13“... package of deformation. As people today have increasing demands for slim and light electronic products...”
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