Showing 1 - 20 results of 28 for search 'SEMICONDUCTOR DEVICES', query time: 4.08s Refine Results
  1. 1
    Modeling and simulation of device variability and reliability at the electrical level
    by Brusamarello, Lucas
    Published 2013
    “... complementary metal-oxide-semiconductor (CMOS) parameter variations pose a challenge for the design of high...”
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  2. 2
    Modeling and simulation of device variability and reliability at the electrical level
    by Brusamarello, Lucas
    Published 2013
    “... complementary metal-oxide-semiconductor (CMOS) parameter variations pose a challenge for the design of high...”
    Get full text
    Others
  3. 3
    Modeling and simulation of device variability and reliability at the electrical level
    by Brusamarello, Lucas
    Published 2013
    “... complementary metal-oxide-semiconductor (CMOS) parameter variations pose a challenge for the design of high...”
    Get full text
    Others
  4. 4
    Modeling and simulation of self-heating effects in p-type MOS transistors
    by Rossetto, Alan Carlos Junior
    Published 2018
    “...The complementary metal-oxide-semiconductor (CMOS) scaling process of the recent decades, coupled...”
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  5. 5
    Análise dos efeitos de dose total ionizante em circuitos analógicos CMOS
    by Rossetto, Alan Carlos Junior
    Published 2015
    “... radiation and the dielectric layers of semiconductor devices, causing charge buildup in these structures...”
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    Others
  6. 6
    Análise dos efeitos de dose total ionizante em circuitos analógicos CMOS
    by Rossetto, Alan Carlos Junior
    Published 2015
    “... radiation and the dielectric layers of semiconductor devices, causing charge buildup in these structures...”
    Get full text
    Others
  7. 7
    Análise dos efeitos de dose total ionizante em circuitos analógicos CMOS
    by Rossetto, Alan Carlos Junior
    Published 2015
    “... radiation and the dielectric layers of semiconductor devices, causing charge buildup in these structures...”
    Get full text
    Others
  8. 8
    Análise dos efeitos de dose total ionizante em transistores CMOS tecnologia 0,35 μm
    by Both, Thiago Hanna
    Published 2015
    “... of semiconductor devices; in MOS transistors, this charge trapping affects electrical parameters such as threshold...”
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    Others
  9. 9
    Caracterização elétrica temporal de transistores de filmes finos de nanopartículas de óxido de zinco
    by Becker, Thales Exenberger
    Published 2018
    “... nanoparticulated zinc oxide (ZnO) as the active semiconductor channel layer are discussed. The growing interest...”
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    Others
  10. 10
    Análise dos efeitos de dose total ionizante em transistores CMOS tecnologia 0,35 μm
    by Both, Thiago Hanna
    Published 2015
    “... of semiconductor devices; in MOS transistors, this charge trapping affects electrical parameters such as threshold...”
    Get full text
    Others
  11. 11
    Caracterização elétrica temporal de transistores de filmes finos de nanopartículas de óxido de zinco
    by Becker, Thales Exenberger
    Published 2018
    “... nanoparticulated zinc oxide (ZnO) as the active semiconductor channel layer are discussed. The growing interest...”
    Get full text
    Others
  12. 12
    Caracterização elétrica temporal de transistores de filmes finos de nanopartículas de óxido de zinco
    by Becker, Thales Exenberger
    Published 2018
    “... nanoparticulated zinc oxide (ZnO) as the active semiconductor channel layer are discussed. The growing interest...”
    Get full text
    Others
  13. 13
    Análise dos efeitos de dose total ionizante em transistores CMOS tecnologia 0,35 μm
    by Both, Thiago Hanna
    Published 2015
    “... of semiconductor devices; in MOS transistors, this charge trapping affects electrical parameters such as threshold...”
    Get full text
    Others
  14. 14
    Trapsimulator : um simulador didático de ruído RTN
    by Melos, Ricardo Carvalho de
    Published 2018
    “... didactic tool under Random Telegraph Noise effect, present in electronic semiconductor devices, more...”
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    Others
  15. 15
    Trapsimulator : um simulador didático de ruído RTN
    by Melos, Ricardo Carvalho de
    Published 2018
    “... didactic tool under Random Telegraph Noise effect, present in electronic semiconductor devices, more...”
    Get full text
    Others
  16. 16
    Trapsimulator : um simulador didático de ruído RTN
    by Melos, Ricardo Carvalho de
    Published 2018
    “... didactic tool under Random Telegraph Noise effect, present in electronic semiconductor devices, more...”
    Get full text
    Others
  17. 17
    Efeitos da radiação ionizante e técnicas de proteção aplicadas a projetos de dispositivos MOS customizados
    by Vaz, Pablo Ilha
    Published 2015
    “... circuits and devices. Architecture level for SEE mitigation techniques usually involves redundancy...”
    Get full text
    Others
  18. 18
    Autocorrelation analysis in frequency domain as a tool for MOSFET low frequency noise characterization
    by Both, Thiago Hanna
    Published 2018
    “... the stability of SRAM cells, for example. Metal-oxide-semiconductor field-effect-transistors (MOSFETs) are known...”
    Get full text
    Others
  19. 19
    Autocorrelation analysis in frequency domain as a tool for MOSFET low frequency noise characterization
    by Both, Thiago Hanna
    Published 2018
    “... the stability of SRAM cells, for example. Metal-oxide-semiconductor field-effect-transistors (MOSFETs) are known...”
    Get full text
    Others
  20. 20
    Efeitos da radiação ionizante e técnicas de proteção aplicadas a projetos de dispositivos MOS customizados
    by Vaz, Pablo Ilha
    Published 2015
    “... circuits and devices. Architecture level for SEE mitigation techniques usually involves redundancy...”
    Get full text
    Others
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