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2by A. A. Khmyl, I. I. Kuzmar, L. K. Kushner, N. V. Bogush, M. M. Borisik, S. M. Zavadski“... characteristics of the product, increase the number of devices produced on a semiconductor wafer, and thereby...”
Published 2019-06-01
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3“...Abstract. Objectives The aim of the work is to study the possibilities for using a semiconductor...”
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4“...The transducer consists on a semiconductor device based on two stacked-i-n heterostructures...”
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7by M. A. KhazamovaSubjects: “...thermoelectric semiconductor device...”
Published 2020-08-01
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9by V. Benda“... reliability of power semiconductor devices have been formulated. In the paper are also discussed some modern...”
Published 2000-01-01
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10“.... This double acquisition is realized by a Michelson interferometer coupled with a Charge Coupled Device (CCD...”
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11by C Kirsch, S Altazin, R Hiestand, T Beierlein, R Ferrini, T Offermans, L Penninck, B Ruhstaller“...The lateral charge transport in thin-film semiconductor devices is affected by the sheet resistance...”
Published 2017-06-01
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12“...The article present the current level of performance in semiconductor technologies, in particular...”
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13“...Piezoelectric devices transduce mechanical energy to electrical energy by elastic deformation...”
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14by V. A. Solodukha, G. G. Chigir, V. A. Pilipenko, V. A. Filipenya, V. A. Gorushko“...The key element determining stability of the semiconductor devices is a gate dielectric. As its...”
Published 2018-12-01
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15by Peacock Anna C., MacFarquhar Stuart J., Franz Yohann, Runge Antoine F. J., Mailis Sakellaris, Oo Swe Z., Mittal Vinita, Chong Harold M. H., Aktas Ozan“...We report results of laser processing of amorphous silicon and silicon-germanium semiconductor...”
Published 2020-01-01
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16by Aiman Rahmanudin, Raymundo Marcial‐Hernandez, Adibah Zamhuri, Alex S. Walton, Daniel J. Tate, Raja U. Khan, Suphaluk Aphichatpanichakul, Andrew B. Foster, Sebastian Broll, Michael L. Turner“...Abstract Organic semiconductors (OSCs) promise to deliver next‐generation electronic and energy...”
Published 2020-11-01
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17“...<span style="font-family: DejaVu Sans,sans-serif;">Two thermodynamic models of semiconductor device...”
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20“.... The thickness measured by profilometer was 150 nm for all films. Moreover, surface acoustic wave (SAW) devices...”
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