Semiconductor device manufacture 180 nm 1 Analog signal processing 1 Build in self tests 1 Built-In Self-Test 1 Built-in self test 1 Builtin self tests (BIST) 1 CMOS 1 CMOS integrated circuits 1 Costs 1 Design flows 1 Design for testability 1 Differential amplifiers 1 Differential difference amplifier 1 Differential difference transconductance amplifier 1 Filter-based 1 Harmonic analysis 1 Harmonic-Canceling filter 1 Harmonic-canceling filter 1 ITS applications 1 Integrated circuit design 1 Mixed mode 1 Mixed-mode filter 1 Mode filters 1 Production cost 1 Quality control 1 Semiconductor industry 1 Signal processing 1 Skew circulant matrix 1 Test applications 1