Showing 1 - 15 results of 15 for search 'SEMICONDUCTOR PROCESS TECHNOLOGY', query time: 0.71s Refine Results
  1. 1
    by Both, Thiago Hanna
    Published 2015
    ... parameters of 0,35 μm CMOS transistors, fabricated with an AMS C35B4 process, due to total ionizing dose (TID...
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  2. 2
    by Both, Thiago Hanna
    Published 2015
    ... parameters of 0,35 μm CMOS transistors, fabricated with an AMS C35B4 process, due to total ionizing dose (TID...
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    Others
  3. 3
    by Both, Thiago Hanna
    Published 2015
    ... parameters of 0,35 μm CMOS transistors, fabricated with an AMS C35B4 process, due to total ionizing dose (TID...
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  4. 4
    ...–Semiconductor (CMOS), uma vez que circuitos CMOS estão sujeitos às falhas transientes oriundas de radiação...
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  5. 5
    ...–Semiconductor (CMOS), uma vez que circuitos CMOS estão sujeitos às falhas transientes oriundas de radiação...
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  6. 6
    ...–Semiconductor (CMOS), uma vez que circuitos CMOS estão sujeitos às falhas transientes oriundas de radiação...
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  7. 7
    by Brusamarello, Lucas
    Published 2013
    ... complementary metal-oxide-semiconductor (CMOS) parameter variations pose a challenge for the design of high...
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  8. 8
    by Brusamarello, Lucas
    Published 2013
    ... complementary metal-oxide-semiconductor (CMOS) parameter variations pose a challenge for the design of high...
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  9. 9
    by Brusamarello, Lucas
    Published 2013
    ... complementary metal-oxide-semiconductor (CMOS) parameter variations pose a challenge for the design of high...
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  10. 10
    by Vaz, Pablo Ilha
    Published 2015
    ... physical mechanisms of radiation effects in semiconductor components and MOS transistors by exploring...
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  11. 11
    by Vaz, Pablo Ilha
    Published 2015
    ... physical mechanisms of radiation effects in semiconductor components and MOS transistors by exploring...
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  12. 12
    by Vaz, Pablo Ilha
    Published 2015
    ... physical mechanisms of radiation effects in semiconductor components and MOS transistors by exploring...
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  13. 13
    by Melos, Ricardo Carvalho de
    Published 2018
    ... didactic tool under Random Telegraph Noise effect, present in electronic semiconductor devices, more...
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  14. 14
    by Melos, Ricardo Carvalho de
    Published 2018
    ... didactic tool under Random Telegraph Noise effect, present in electronic semiconductor devices, more...
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  15. 15
    by Melos, Ricardo Carvalho de
    Published 2018
    ... didactic tool under Random Telegraph Noise effect, present in electronic semiconductor devices, more...
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