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Robert A. Reed
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1
Bulk Silicon-Germanium Heterojunction Bipolar Transistor Process Feature Implications for Single-Event Effects Analysis and Charge Collection Mechanisms
by
Pellish, Jonathan Allen
Published 2008
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2
Radiation-Induced Energy Deposition and Single Event Upset Error Rates in Scaled Microelectronic Structures
by
Howe, Christina L
Published 2005
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3
EFFICIENT CHARACTERIZATION OF TRANSIENT PULSE SHAPES FROM RADIATION INDUCED UPSETS.
by
Bennett, William Geoffrey
Published 2012
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4
A GENERALIZED SINGLE-EVENT ANALYSIS AND HARDENING OPTIONS FOR MIXED-SIGNAL PHASE-LOCKED LOOP CIRCUITS
by
Loveless, Thomas Daniel
Published 2009
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5
Single-Event Mechanisms in InAlSb/InAs/AlGaSb High Electron Mobility Transistors
by
Ramachandran, Vishwanath
Published 2013
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6
CHARGE COLLECTION MECHANISMS IN AlGaN/GaN MOS HIGH ELECTRON MOBILITY TRANSISTORS
by
Samsel, Isaak Knox
Published 2014
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7
Energetic electron-induced single event upsets in static random access memory
by
King, Michael Patrick
Published 2014
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8
Charge Collection Mechanisms in Silicon Devices During High-Level Carrier Generation Events
by
Hooten, Nicholas C
Published 2014
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9
A TECHNIQUE FOR PREDICTING THE MUON INDUCED UPSET CROSS SECTION IN SUBMICRON MOS DEVICES USING PROTON TESTS AND SIMULATION
by
Trippe, James Michael
Published 2014
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10
X-ray and Proton Radiation Effects on 40 nm CMOS Physically Unclonable Function Devices
by
Wang, Pengfei
Published 2017
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Robert A. Reed
Bennett, William Geoffrey
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Hooten, Nicholas C
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Howe, Christina L
1
King, Michael Patrick
1
Loveless, Thomas Daniel
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Pellish, Jonathan Allen
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Ramachandran, Vishwanath
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Trippe, James Michael
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