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A. Vembris
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1
Spatial mapping of optical constants and thickness variations in ITO films and SiO2 buffer layers
by
I. Aulika
,
P. Paulsone
,
E. Laizane
,
J. Butikova
,
A. Vembris
Published in
Optical Materials: X
(2025-05-01)
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2
Comprehensive optical characterization of organic thin films for OLED applications via spectroscopic ellipsometryZenodoZenodo
by
I. Aulika
,
P. Paulsone
,
J. Butikova
,
K.A. Štucere
,
A. Vembris
Published in
Optical Materials: X
(2025-07-01)
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