Search Results - A. Vembris

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    Spatial mapping of optical constants and thickness variations in ITO films and SiO2 buffer layers by I. Aulika, P. Paulsone, E. Laizane, J. Butikova, A. Vembris

    Published in Optical Materials: X (2025-05-01)
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  2. 2

    Comprehensive optical characterization of organic thin films for OLED applications via spectroscopic ellipsometryZenodoZenodo by I. Aulika, P. Paulsone, J. Butikova, K.A. Štucere, A. Vembris

    Published in Optical Materials: X (2025-07-01)
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