Search Results - Alex Plotkowski
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Enabling rapid X-ray CT characterisation for additive manufacturing using CAD models and deep learning-based reconstruction by Amirkoushyar Ziabari, S. V. Venkatakrishnan, Zackary Snow, Aleksander Lisovich, Michael Sprayberry, Paul Brackman, Curtis Frederick, Pradeep Bhattad, Sarah Graham, Philip Bingham, Ryan Dehoff, Alex Plotkowski, Vincent Paquit
Published in npj Computational Materials (2023-05-01)Get full text
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