Search Results - Cheng-Jun Huang
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Hf-Based and Zr-Based Charge Trapping Layer Engineering for E-Mode GaN MIS-HEMT Using Ferroelectric Charge Trap Gate Stack by Jui-Sheng Wu, Chih-Chieh Lee, Chia-Hsun Wu, Cheng-Jun Huang, Yan-Kui Liang, You-Chen Weng, Edward Yi Chang
Published in IEEE Journal of the Electron Devices Society (2022-01-01)Get full text
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Optimization of NoN-melt-back-etching and selectivity for selective area growth of GaN drain on Si (100) substrate by Cheng-Jun Huang, Shuo Hwai, Tsai-Fu Chung, Chien-Nan Hsiao, Bo-Cheng Lin, Hung-Ching Tsai, Chi Huang Lui, Edward. Yi Chang, Mau-Chung Frank Chang
Published in AIP Advances (2025-05-01)Get full text
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Strained-channel Si n-MOSFET with GaN-drain via dual-step selective epitaxy for mobility enhancement on Si(100) substrate by Cheng-Jun Huang, Shuo Hwai, Tsai-Fu Chung, Chien-Nan Hsiao, Bo-Cheng Lin, Hung-Ching Tsai, Chi Huang Lui, Edward Yi Chang, Mau-Chung Frank Chang
Published in AIP Advances (2025-05-01)Get full text
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