Search Results - Dimitri Lederer

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    On-wafer wideband characterization: a powerful tool for improving the IC technologies by Dimitri Lederer, Jean-Pierre Raskin

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    Probe-Dependent Residual Error Analysis for Accurate On-Wafer MOSFET Measurements up to 110 GHz by Lucas Nyssens, Shiqi Ma, Martin Rack, Dimitri Lederer, Jean-pierre Raskin

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