Search Results - Eickhoff Martin

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    Measuring electric fields with 4D-STEM: Demonstration of pitfalls by the example of GaN and SiGe by Grieb Tim, Mahr Christoph, Krause Florian F., Müller-Caspary Knut, Schowalter Marco, Eickhoff Martin, Rosenauer Andreas

    Published in BIO Web of Conferences (2024-01-01)
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    Quarantotto: A 48-segment STEM detector for enhanced STEM performance and new applications by Vespucci Stefano, Bosch Eric G. T., Lazić Ivan, de Vries Bert, Egoavil Ricardo, Freitag Bert, Grieb Tim, Krause Florian F., Eickhoff Martin, Rosenauer Andreas

    Published in BIO Web of Conferences (2024-01-01)
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