Search Results - Huth Michael

  • Showing 1 - 1 results of 1
Refine Results
  1. 1

    Breaking the limits of functional Atomic Force Microscopy imaging using Focused Electron Beam Induced Deposition by Brugger-Hatzl Michele, Seewald Lukas, Winkler Robert, Kuhness David, Huth Michael, Barth Sven, Plank Harald

    Published in BIO Web of Conferences (2024-01-01)
    Get full text
    Article


Search Tools: