Search Results - Ken Tierney

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    Detecting the overfilled status of domestic and commercial bins using computer vision by Cathaoir Agnew, Dishant Mewada, Eoin M. Grua, Ciarán Eising, Patrick Denny, Mark Heffernan, Ken Tierney, Pepijn Van de Ven, Anthony Scanlan

    Published in Intelligent Systems with Applications (2023-05-01)
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    Contamination Detection From Highly Cluttered Waste Scenes Using Computer Vision by Dishant Mewada, Cathaoir Agnew, Eoin M. Grua, Ciaran Eising, Patrick Denny, Mark Heffernan, Ken Tierney, Pepijn van de Ven, Anthony Scanlan

    Published in IEEE Access (2024-01-01)
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