検索結果 - Matteo Buffolo

Dynamic Performance Characterization Techniques in Gallium Nitride-Based Electronic Devices 著者: Carlo De Santi, Matteo Buffolo, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini

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Impact of Generation and Relocation of Defects on Optical Degradation of Multi-Quantum-Well InGaN/GaN-Based Light-Emitting Diode 著者: Claudia Casu, Matteo Buffolo, Alessandro Caria, Carlo De Santi, Enrico Zanoni, Gaudenzio Meneghesso, Matteo Meneghini

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Lifetime Prediction of Current-and Temperature-Induced Degradation in Silicone-Encapsulated 365 nm High-Power Light-Emitting Diodes 著者: Alexander Herzog, Simon Benkner, Babak Zandi, Matteo Buffolo, Willem D. Van Driel, Matteo Meneghini, Tran Quoc Khanh

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Efficiency- and lifetime-limiting effects of commercially available UVC LEDs: a review 著者: Grigory Onushkin, Jan Ruschel, Francesco Piva, Matteo Buffolo, Jens Rass, Lynn Davis, Nicola Trivellin, Carlo De Santi, Willem van Driel, Matteo Meneghini

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Understanding the Leakage Mechanisms and Breakdown Limits of Vertical GaN-on-Si p⁺n⁻n Diodes: The Road to Reliable Vertical MOSFETs 著者: Kalparupa Mukherjee, Carlo De Santi, Matteo Buffolo, Matteo Borga, Shuzhen You, Karen Geens, Benoit Bakeroot, Stefaan Decoutere, Andrea Gerosa, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini

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Long-Term Analysis of Temperature and Current-Dependent Degradation in Green High-Power Light-Emitting Diodes 著者: Alexander Herzog, Matteo Buffolo, Francesco Piva, Simon Benkner, Babak Zandi, Jens Balasus, Paul Myland, Felix Wirth, Willem D. van Driel, Matteo Meneghini, Tran Quoc Khanh

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Investigating the optical degradation of InAs quantum dot lasers on silicon through combined electro-optical characterization and gain measurements 著者: Michele Zenari, Marco Novarese, Matteo Buffolo, Carlo De Santi, Justin Norman, Eamonn T Hughes, John E Bowers, Robert W Herrick, Mariangela Gioannini, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini

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Modeling of the Electrical Characteristics and Degradation Mechanisms of UV-C LEDs 著者: Nicola Roccato, Francesco Piva, Carlo De Santi, Matteo Buffolo, Normal Susilo, Daniel Hauer Vidal, Anton Muhin, Luca Sulmoni, Tim Wernicke, Micheal Kneissl, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini

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Modeling the capacitance–voltage characteristics of AlGaN-based UV-C LEDs 著者: Nicola Roccato, Francesco Piva, Matteo Buffolo, Carlo De Santi, Nicola Trivellin, Marcel Schilling, Anton Muhin, Jakob Höpfner, Martin Guttmann, Tim Wernicke, Michael Kneissl, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini

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Negative Activation Energy of Gate Reliability in Schottky-Gate p-GaN HEMTs: Combined Gate Leakage Current Modeling and Spectral Electroluminescence Investigation 著者: Manuel Fregolent, Mirco Boito, Michele Disaro, Carlo De Santi, Matteo Buffolo, Eleonora Canato, Michele Gallo, Cristina Miccoli, Isabella Rossetto, Giansalvo Pizzo, Alfio Russo, Ferdinando Iucolano, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini

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Quality Assessment of Perovskite Solar Cells: An Industrial Point of View 著者: Nicolò Lago, Francesco Moretti, Noah Tormena, Alessandro Caria, Matteo Buffolo, Carlo De Santi, Nicola Trivellin, Andrea Cester, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini, Fabio Matteocci, Jessica Barichello, Luigi Vesce, Aldo Di Carlo, Federico Quartiani

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