Search Results - Richard Neumann

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  1. 1

    A new preparation approach for high-resolution TEM analysis of electrically active defects in p-GaN HEMT devices from two orthogonal perspectives by Patrick Diehle, Frank Altmann, Susanne Hübner, Johannes Bruckmeier, Richard Neumann, Manuel Stabentheiner, Clemens Ostermaier

    Published in Power Electronic Devices and Components (2025-06-01)
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  2. 2

    Direct investigation of localized leakage currents in GaN-on-sapphire pn-diodes by Alexander D. Kinstler, Richard Neumann, Aidan Arthur Taylor, Sven Besendörfer, Elke Meissner, Roland Weingärtner, Frank Brunner, Enrico Brusaterra, Eldad Bahat Treidel, Jörg Schulze

    Published in Scientific Reports (2025-11-01)
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  3. 3

    Correction: Direct investigation of localized leakage currents in GaN-on-sapphire pn-diodes by Alexander D. Kinstler, Richard Neumann, Aidan Arthur Taylor, Sven Besendörfer, Elke Meissner, Roland Weingärtner, Frank Brunner, Enrico Brusaterra, Eldad Bahat Treidel, Jörg Schulze

    Published in Scientific Reports (2026-05-01)
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