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Roman I. Gvozdev
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Adapted method for monitoring functional failures in NOR FLASH-memory during tests for resistance to heavy charged particles
by
Roman I. Gvozdev
,
Ivan I. Shvetsov-Shilovskiy
,
Sergey B. Shmakov
Published in
Безопасность информационных технологий
(2020-09-01)
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