Search Results - Runding Luo
- Showing 1 - 1 results of 1
-
1
High-temperature time-dependent dielectric breakdown of 4H-SiC MOS capacitors by Xinlan Hou, Runding Luo, Qibin Liu, Yanqing Chi, Jie Zhang, Hongping Ma, Qingchun Zhang, Jiajie Fan
Published in Case Studies in Thermal Engineering (2024-11-01)Get full text
Article
