Search Results - Runding Luo
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High-temperature time-dependent dielectric breakdown of 4H-SiC MOS capacitors by Xinlan Hou, Runding Luo, Qibin Liu, Yanqing Chi, Jie Zhang, Hongping Ma, Qingchun Zhang, Jiajie Fan
Published in Case Studies in Thermal Engineering (2024-11-01)Get full text
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