Search Results - Samuel Graham

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  1. 1

    Comparison of the cohesive and delamination fatigue properties of atomic-layer-deposited alumina and titania ultrathin protective coatings deposited at 200 °C by Farzad Sadeghi-Tohidi, David Samet, Samuel Graham, Olivier N Pierron

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  2. 2

    Thermal conductance across β-Ga2O3-diamond van der Waals heterogeneous interfaces by Zhe Cheng, Luke Yates, Jingjing Shi, Marko J. Tadjer, Karl D. Hobart, Samuel Graham

    Published in APL Materials (2019-03-01)
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  3. 3

    Experimental and computational analysis of thermal environment in the operation of HfO2 memristors by Darshan G. Pahinkar, Pradip Basnet, Matthew P. West, Bill Zivasatienraj, Alex Weidenbach, W. Alan Doolittle, Eric Vogel, Samuel Graham

    Published in AIP Advances (2020-03-01)
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  4. 4

    Low Thermal Resistance of Diamond‐AlGaN Interfaces Achieved Using Carbide Interlayers by Henry T. Aller, Thomas W. Pfeifer, Abdullah Mamun, Kenny Huynh, Marko Tadjer, Tatyana Feygelson, Karl Hobart, Travis Anderson, Bradford Pate, Alan Jacobs, James Spencer Lundh, Mark Goorsky, Asif Khan, Patrick Hopkins, Samuel Graham

    Published in Advanced Materials Interfaces (2025-02-01)
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  5. 5

    Scaled ultra-wide bandgap AlGaN polarization-graded FET with ultra-thin buffer layer by Yinxuan Zhu, Ashley Wissel-Garcia, Kidus Guye, Chandan Joishi, Can Cao, Seungheon Shin, Kyle Liddy, Emils G. B. Jurcik, Agnes Maneesha Dominic Merwin Xavier, Andrew A. Allerman, Brianna A. Klein, Andrew M. Armstrong, James S. Speck, Samuel Graham, Siddharth Rajan

    Published in APL Electronic Devices (2026-06-01)
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  6. 6

    Lossless Phonon Transition Through GaN‐Diamond and Si‐Diamond Interfaces by Mohamadali Malakoutian, Kelly Woo, Dennis Rich, Ramandeep Mandia, Xiang Zheng, Anna Kasperovich, Devansh Saraswat, Rohith Soman, Youhwan Jo, Thomas Pfeifer, Taesoon Hwang, Henry Aller, Jeongkyu Kim, Junrui Lyu, Janelle Keionna Mabrey, Thomas Andres Rodriguez, James Pomeroy, Patrick E. Hopkins, Samuel Graham, David J. Smith, Subhasish Mitra, Kyeongjae Cho, Martin Kuball, Srabanti Chowdhury

    Published in Advanced Electronic Materials (2025-01-01)
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