Search Results - Spiecker Erdmann
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Uncovering microscopic details of shearing mechanisms in the L12 structure by unambiguous stacking fault analysis by Karpstein Nicolas, Lenz Malte, Bezold Andreas, Zehl Rico, Wu Mingjian, Ludwig Alfred, Laplanche Guillaume, Neumeier Steffen, Spiecker Erdmann
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Improving electron tomography of mesoporous silica structures by Ga intrusion by Przybilla Thomas, Böhmer Johannes, Kichigin Alexander, Buwen Moritz, Götz Allison, Drobek Dominik, Söllner Jakob, Thommes Matthias, Zubiri Benjamin Apeleo, Spiecker Erdmann
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Towards in-situ 4D-STEM observation of texture evolution in nano-crystalline thin films by Wu Mingjian, Hsieh Chang-Lin, Stroppa Daniel, Pelz Philipp, Ophus Colin, Lu Penghan, Dunin-Borkowski Rafal, Harreiss Christina, Denninger Peter, Spiecker Erdmann
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Introducing a FAIR RDM infrastructure for electron microscopy and other materials science data by Koch Christoph, Kühbach Markus, Shabih Sherjeel, Brockhauser Sandor, Spiecker Erdmann, Scheidgen Markus, Himanen Lauri, Fekete Ádám, Márquez José A., Weber Heiko, Draxl Claudia
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Texture analysis of radiation sensitive organic films: Comparative study by electron diffraction tomography and GIWAXS by Kraus Irene, Wu Mingjian, Rechberger Stefanie, Will Johannes, Maiti Santanu, Kuhlmann Andreas, Huck Marten, Steinberger Marc, Brabec Christoph, Steinrück Hans-Georg, Unruh Tobias, Spiecker Erdmann
Published in BIO Web of Conferences (2024-01-01)Get full text
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