Search Results - Thomas E. Beechem

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    Near-field imaging of optical resonances in silicon metasurfaces using photoelectron microscopy by Alex Boehm, Sylvain D. Gennaro, Chloe F. Doiron, Thomas E. Beechem, Michael B. Sinclair, Igal Brener, Raktim Sarma, Taisuke Ohta

    Published in APL Photonics (2024-06-01)
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  2. 2

    Phase Transformations Driving Biaxial Stress Reduction During Wake‐Up of Ferroelectric Hafnium Zirconium Oxide Thin Films by Samantha T. Jaszewski, Shelby S. Fields, Sebastian Calderon, Benjamin L. Aronson, Thomas E. Beechem, Kyle P. Kelley, Casey Zhang, Megan K. Lenox, Ian A. Brummel, Elizabeth C. Dickey, Jon F. Ihlefeld

    Published in Advanced Electronic Materials (2024-11-01)
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