Search Results - Ullrich Pietsch

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    Determination of the stacking fault density in highly defective single GaAs nanowires by means of coherent diffraction imaging by Arman Davtyan, Andreas Biermanns, Otmar Loffeld, Ullrich Pietsch

    Published in New Journal of Physics (2016-01-01)
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  2. 2

    Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical Measurements by Eduard Mikayelyan, Linda Grodd, Viachaslau Ksianzou, Daniel Wesner, Alexander I. Rodygin, Holger Schönherr, Yuriy N. Luponosov, Sergei A. Ponomarenko, Dimitri A. Ivanov, Ullrich Pietsch, Souren Grigorian

    Published in Nanoscale Research Letters (2019-05-01)
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